Defect-oriented testing and defective-part-level prediction

被引：34

作者：

Dworak, J

Wicker, JD

Lee, S

Grimaila, MR

Mercer, MR

Butler, KM

Stewart, B

Wang, LC

机构：

[1] Texas A&M Univ, Dept Elect Engn, College Stn, TX 77843 USA

[2] Texas Instruments Inc, Dallas, TX 75265 USA

[3] Univ Calif Santa Barbara, Santa Barbara, CA 93106 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2001年 / 18卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/54.902820

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A defective-part-level model combined with a method for choosing test patterns that use site observation can predict defect levels in submicron ICs more accurately than simple stuck-at fault analysis.

引用

页码：31 / 41

页数：11

共 10 条

[1]

[Anonymous], P DAC

[2]

DWORAK J, P INT TEST C, P930

[3]

DWORAK J, P 2000 AS TEST S, P151

[4] REDO - Random excitation and deterministic observation - First commercial experiment [J].

Grimaila, MR ;

Lee, S ;

Dworak, J ;

Butler, KM ;

Stewart, B ;

Balachandran, H ;

Houchins, B ;

Mathur, V ;

Park, J ;

Wang, LC ;

Mercer, MR .

17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, :268-274

[5]

MA S, 1999, P INT TEST C, P587

[6]

Ma SC, 1995, PROCEEDINGS - INTERNATIONAL TEST CONFERENCE 1995, P663, DOI 10.1109/TEST.1995.529895

[7]

Maxwell P. C., 1992, Proceedings International Test Conference 1992 (Cat. No.92CH3191-4), P168, DOI 10.1109/TEST.1992.527817

[8] On applying non-classical defect models to automated diagnosis [J].

Saxena, J ;

Butler, KM ;

Balachandran, H ;

Lavo, DB ;

Chess, B ;

Larrabee, T ;

Ferguson, FJ .

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, :748-757

[9] Computer-aided fault to defect mapping (CAFDM) for defect diagnosis [J].

Stanojevic, Z ;

Balachandran, H ;

Walker, DMH ;

Lakhani, F ;

Jandhyala, S ;

Saxena, J ;

Butler, KM .

INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS, 2000, :729-738

[10]

WILLIAMS TW, 1981, IEEE T COMPUT, V30, P987, DOI 10.1109/TC.1981.1675742

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