Nondegenerate Electron Plasma in a Layer in an External Electric Field with a Mirror Boundary Condition

被引:2
作者
Gordeeva, N. M. [1 ]
Yushkanov, A. A. [2 ]
机构
[1] Bauman State Tech Univ, Moscow 105005, Russia
[2] Moscow State Reg Univ, Moscow 105005, Russia
关键词
OPTICAL-PROPERTIES;
D O I
10.1134/S0018151X18050103
中图分类号
O59 [应用物理学];
学科分类号
摘要
An analytical solution is obtained for the linearized problem on the behavior of collisionless nondegenerate electron plasma in a layer located in an external alternating electric field. It is assumed that the electrons are mirror-reflected from the plasma boundary. The expansion of the solution in eigenfunctions of the corresponding characteristic system is established. The value of the absorption of the electric field energy in the layer is calculated. A case in which the frequency of the external field is close to the plasma frequency is investigated. It is shown that oscillations are observed in the dependence of the absorption on the frequency at frequencies above that of the plasma. These oscillations are associated with the excitation of plasma oscillations in the layer.
引用
收藏
页码:640 / 647
页数:8
相关论文
共 23 条
[1]   On the transverse dielectric permittivity of degenerate electron plasma [J].
Bobrov, V. B. .
HIGH TEMPERATURE, 2017, 55 (04) :473-476
[2]  
GOKHFELD VM, 1985, ZH EKSP TEOR FIZ+, V89, P985
[3]   NONLOCAL THEORY OF OPTICAL PROPERTIES OF THIN METALLIC FILMS [J].
JONES, WE ;
KLIEWER, KL ;
FUCHS, R .
PHYSICAL REVIEW, 1969, 178 (03) :1201-&
[4]   P-POLARIZED OPTICAL-PROPERTIES OF A METAL WITH A DIFFUSELY SCATTERING SURFACE [J].
KELLER, JM ;
FUCHS, R ;
KLIEWER, KL .
PHYSICAL REVIEW B, 1975, 12 (06) :2012-2029
[5]  
Kolesnikov A. F, 2000, 20002570 AIAA
[6]  
Kolesnikov A. F, 2000, 20012871 AIAA
[7]  
Kondratenko A.N., 1979, PRONIKNOVENIE VOLN V
[8]  
Landau L.D, 1969, COLLECTION SCI WORKS, V1, P234
[9]   The longitudinal electric current in Maxwellian collisional plasma generated by a transverse electromagnetic wave [J].
Latyshev, A. V. ;
Yushkanov, A. A. .
HIGH TEMPERATURE, 2017, 55 (05) :631-637
[10]   Nanofilm thickness measurement by resonant frequencies [J].
Latyshev, A. V. ;
Yushkanov, A. A. .
QUANTUM ELECTRONICS, 2015, 45 (03) :270-274