Scattering and recoiling imaging code (SARIC)

被引:62
作者
Bykov, V [1 ]
Kim, C [1 ]
Sung, MM [1 ]
Boyd, KJ [1 ]
Todorov, SS [1 ]
Rabalais, JW [1 ]
机构
[1] UNIV HOUSTON, DEPT CHEM, HOUSTON, TX 77204 USA
关键词
D O I
10.1016/0168-583X(96)00192-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new classical ion trajectory simulation program based on the binary collision approximation has been developed in order to support the results of time-of-flight scattering and recoiling spectrometry (TOF-SARS) and scattering and recoiling imaging spectrometry (SARIS). The code was designed to provide information directly related to the TOF-SARS and SARIS measurements and to operate efficiently on small personal computers. The calculation uses the Ziegler-Biersack-Littmark (ZBL) universal screening function or the Moliere screening function to simulate the three-dimensional motion of atomic particles and includes simultaneous collisions involving several atoms. For TOF-SARS, the program calculates the energy and time-of-flight distributions of scattered and recoiled particles, polar (incident) angle a-scans, and azimuthal angle delta-scans. For SARIS, the program provides images of the scattering and recoiling intensities in polar exit angle and azimuthal angle (beta, delta)-space. A two-dimensional reliability factor (R) has been developed in order to obtain a quantitative comparison of experimental and simulated images. Examples of simulations are presented for Ni{100}, {110} and {111} surfaces and a Pt{111} surface. The R-factor is used to quantitatively compare the simulated Pt{111} image to an experimentally emulated image.
引用
收藏
页码:371 / 378
页数:8
相关论文
共 14 条
[1]  
Eckstein W., 1991, COMPUTER SIMULATION
[2]   TIME-OF-FLIGHT SCATTERING AND RECOILING SPECTROMETER (TOF-SARS) FOR SURFACE-ANALYSIS [J].
GRIZZI, O ;
SHI, M ;
BU, H ;
RABALAIS, JW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (02) :740-752
[3]   TIME-OF-FLIGHT SCATTERING AND RECOILING SPECTROMETRY .1. STRUCTURE OF THE W(211) SURFACE [J].
GRIZZI, O ;
SHI, M ;
BU, H ;
RABALAIS, JW ;
HOCHMANN, P .
PHYSICAL REVIEW B, 1989, 40 (15) :10127-10146
[4]  
HOU M, 1976, NUCL INSTRUM METHODS, V131, P641
[5]  
Maclaren J. M., 1987, SURFACE CRYSTALLOGRA
[6]  
Mashkova E. S., 1985, Medium-Energy Ion Reflection from Solids
[7]   TIME-OF-FLIGHT SCATTERING AND RECOILING SPECTROMETRY (TOF-SARS) ANALYSIS OF PT(110) .1. QUANTITATIVE STRUCTURAL STUDY OF THE CLEAN (1X2) SURFACE [J].
MASSON, F ;
RABALAIS, JW .
SURFACE SCIENCE, 1991, 253 (1-3) :245-257
[8]   EXPERIMENTAL REALIZATION OF LOW-ENERGY SURFACE CHANNELING [J].
NIEHOF, A ;
HEILAND, W .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 48 (1-4) :306-310
[9]   SCATTERING AND RECOILING SPECTROMETRY - AN IONS EYE VIEW OF SURFACE-STRUCTURE [J].
RABALAIS, JW .
SCIENCE, 1990, 250 (4980) :521-527
[10]  
SHI M, 1990, PHYS REV B, V42, P2825