Object size effect on the contact potential difference measured by scanning Kelvin probe method

被引：4

作者：

Polyakov, B. ^{[1
]}

Krutokhvostov, R. ^{[1
]}

Kuzmin, A. ^{[1
]}

Tamanis, E. ^{[2
]}

Muzikante, I. ^{[1
]}

Tale, I. ^{[1
]}

机构：

[1] Univ Latvia, Inst Solid State Phys, LV-1063 Riga, Latvia

[2] Daugavpils Univ, G Liberta Innovat Microscopy Ctr, LV-5401 Daugavpils, Latvia

来源：

EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2010年 / 51卷 / 02期

关键词：

FORCE MICROSCOPY; WORK FUNCTION; RESOLUTION; OXIDE; SCIENCE;

D O I：

10.1051/epjap/2010088

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10-30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 mu m. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.

引用

页数：5

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