Analysis on the adhesion of micro-comb structure in MEMS

被引:20
作者
Liu, Haipeng [1 ]
Gao, Shiqiao [1 ]
Niu, Shaohua [1 ]
Jin, Lei [1 ]
机构
[1] Beijing Inst Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China
关键词
Micro-comb structure; adhesion; capacitive micromachined gyroscope; micro forces;
D O I
10.3233/JAE-2010-1210
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The comb capacitive micromachined gyroscope is a kind of typical MEMS sensor. Electrostatic driving and comb capacitive detection are its typical working mode. Recently, researchers have found that the narrow space between two combs can result in comb adhesion easily because of micro scaling effect. In this paper, some micro forces such as capillary force, Van der Waals force, electrostatic force and Casimir force were analyzed and the relation curves of micro force and its acting distance were obtained. In order to make sure the influences of relative humidity on the micro-combs, a contrast experiment was also carried out. Through analysis on the micro forces, the acting distance curves of micro forces were finally obtained.
引用
收藏
页码:979 / 984
页数:6
相关论文
共 8 条
[1]   Quantum mechanical actuation of microelectromechanical systems by the Casimir force [J].
Chan, HB ;
Aksyuk, VA ;
Kleiman, RN ;
Bishop, DJ ;
Capasso, F .
SCIENCE, 2001, 291 (5510) :1941-1944
[2]   The role of van der Waals forces in adhesion of micromachined surfaces [J].
Delrio, FW ;
De Boer, MP ;
Knapp, JA ;
Reedy, ED ;
Clews, PJ ;
Dunn, ML .
NATURE MATERIALS, 2005, 4 (08) :629-634
[3]   Capillary force in atomic force microscopy [J].
Jang, JK ;
Schatz, GC ;
Ratner, MA .
JOURNAL OF CHEMICAL PHYSICS, 2004, 120 (03) :1157-1160
[4]  
Shigiao Gao, 2008, MEMS MECH
[5]   Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy [J].
Stifter, T ;
Marti, O ;
Bhushan, B .
PHYSICAL REVIEW B, 2000, 62 (20) :13667-13673
[6]  
TASY N, 1996, MICROMECH MICROENG, V6, P385
[7]   Experimental study of sidewall adhesion in microelectromechanical systems [J].
Timpe, SJ ;
Komvopoulos, K .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2005, 14 (06) :1356-1363
[8]   On forces in microelectromechanical systems [J].
Zhou, SA .
INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE, 2003, 41 (3-5) :313-335