Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties

被引:58
作者
Raghavan, R. [1 ]
Bechelany, M. [2 ]
Parlinska, M. [3 ]
Frey, D. [1 ]
Mook, W. M. [1 ]
Beyer, A. [4 ]
Michler, J. [1 ]
Utke, I. [1 ]
机构
[1] EMPA, Swiss Fed Labs Mat Sci & Technol, Lab Mech Mat & Nanostruct, CH-3602 Thun, Switzerland
[2] Univ Montpellier 2, Inst Europe Membranes IEM, ENSCM, CNRS,UM2,UMR 5635, F-34095 Montpellier 2, France
[3] EMPA, Swiss Fed Labs Mat Sci & Technol, Electron Microscopy Ctr, CH-8600 Dubendorf, Switzerland
[4] Univ Bielefeld, Fac Phys, D-33615 Bielefeld, Germany
关键词
NANOSTRUCTURED MATERIALS; ELECTRON-MICROSCOPY; BEHAVIOR; HARDNESS; METALS; DESIGN; FILMS; OXIDE; GRAIN;
D O I
10.1063/1.4711767
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on a comprehensive structural and nanoindentation study of nanolaminates of Al2O3 and ZnO synthesized by atomic layer deposition (ALD). By reducing the bilayer thickness from 50 nm to below 1 nm, the nanocrystal size could be controlled in the nanolaminate structure. The softer and more compliant response of the multilayers as compared to the single layers of Al2O3 and ZnO is attributed to the structural change from nanocrystalline to amorphous at smaller bilayer thicknesses. It is also shown that ALD is a unique technique for studying the inverse Hall-Petch softening mechanism (E. Voce and D. Tabor, J. Inst. Metals 79(12), 465 (1951)) related to grain size effects in nanomaterials. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4711767]
引用
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页数:4
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