Time-to-Digital Converter With Sample-and-Hold and Quantization Noise Scrambling Using Harmonics in Ring Oscillators

被引:12
作者
Caram, Juan Pablo [1 ,2 ]
Galloway, Jeff [2 ]
Kenney, J. Stevenson [1 ]
机构
[1] Georgia Inst Technol, Dept Elect & Comp Engn, Atlanta, GA 30332 USA
[2] Silicon Creat LLC, Suwanee, GA 30024 USA
关键词
Time-to-digital converter; digital phase-locked loop; sample-and-hold; oversampling; ring oscillator; harmonics; PHASE NOISE; CMOS; JITTER; ERRORS; TDC;
D O I
10.1109/TCSI.2017.2712518
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high-resolution, high-bandwidth, and noise-scrambling, time-to-digital converter (TDC) is presented. Its architecture, which exploits harmonics in ring oscillators, provides a sample-and-hold mechanism in the form of relative phase. This storage mechanism is highly insensitive to noise and allows for oversampling between input events, therefore, can be designed for very high bandwidth. It can achieve lower quantization noise with fewer measurements than noise-shaping TDCs. This paper presents the architecture in detail, an in-depth analysis of noise sensitivity of the time storage mechanism, and the results from a prototype implemented in a 28-nm CMOS process.
引用
收藏
页码:74 / 83
页数:10
相关论文
共 29 条
[1]   Phase noise and jitter in CMOS ring oscillators [J].
Abidi, Asad A. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (08) :1803-1816
[2]   Efficient Mitigation of SET Induced Harmonic Errors in Ring Oscillators [J].
Agustin, Javier ;
Luisa Lopez-Vallejo, Maria ;
Gil Soriano, Carlos ;
Cholbi, Pablo ;
Massengill, Lloyd W. ;
Chen, Yanran P. .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (06) :3049-3056
[3]  
[Anonymous], 2016, DESIGN ANALOG CMOS I
[4]   THE VERNIER TIME-MEASURING TECHNIQUE [J].
BARON, RG .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (01) :21-30
[5]   SPECTRA OF QUANTIZED SIGNALS [J].
BENNETT, WR .
BELL SYSTEM TECHNICAL JOURNAL, 1948, 27 (03) :446-472
[6]   Generation, Elimination and Utilization of Harmonics in Ring Oscillators [J].
Bhushan, Manjul ;
Ketchen, Mark B. .
2010 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, 23RD IEEE ICMTS CONFERENCE PROCEEDINGS, 2010, :108-113
[7]  
Caram JP, 2015, IEEE INT SYMP CIRC S, P161, DOI 10.1109/ISCAS.2015.7168595
[8]   Single-Event Transient Induced Harmonic Errors in Digitally Controlled Ring Oscillators [J].
Chen, Y. P. ;
Loveless, T. D. ;
Maillard, P. ;
Gaspard, N. J. ;
Jagannathan, S. ;
Sternberg, A. L. ;
Zhang, E. X. ;
Witulski, A. F. ;
Bhuva, B. L. ;
Holman, T. W. ;
Massengill, L. W. .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 61 (06) :3163-3170
[9]   Phase noise and timing jitter in oscillators with colored-noise sources [J].
Demir, A .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 2002, 49 (12) :1782-1791
[10]   A Noise-Shaping Time-to-Digital Converter Using Switched-Ring Oscillators-Analysis, Design, and Measurement Techniques [J].
Elshazly, Amr ;
Rao, Sachin ;
Young, Brian ;
Hanumolu, Pavan Kumar .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2014, 49 (05) :1184-1197