Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches

被引:37
作者
Bockstedte, Michel [1 ]
Gali, Adam [2 ]
Mattausch, Alexander [1 ]
Pankratov, Oleg [1 ]
Steeds, John W. [3 ]
机构
[1] Univ Erlangen Nurnberg, Lehrstuhl Theoret Festkorperphys, D-91058 Erlangen, Germany
[2] Budapest Univ Technol & Econ, Dept Atom Phys, H-1111 Budapest, Hungary
[3] Univ Bristol, Dept Phys, Bristol BS8 1TL, Avon, England
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2008年 / 245卷 / 07期
关键词
D O I
10.1002/pssb.200844048
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
In SiC, mobile point defects may form thermally stable clusters and aggregates, such as di-vacancies or carbon interstitial complexes. Although predicted by theory, experimental evidence of such clusters became available only recently. Combining theoretical and experimental approaches, the unique identification of the di-vacancy, the carbon vacancy-antisite complex with the spin resonance centers P6/P7 and SI5 was recently achieved. In this way also the di-carbon and tri-carbon antisites with the photoluminiscence centers P-T and U, HT3 and HT4, respectively were identified. The two identified vacancy complexes show distinct properties: while the di-vacancy, like the silicon vacancy possesses a high-spin ground state, the carbon vacancy-antisite complex, like the carbon vacancy, is a Jahn-Teller center. These effects consistently explain the complex properties of the spin resonance spectra and are discussed in detail for the isolated vacancies. The aggregation of vacancies proved to be relevant in the explantation of the kinetic deactivation of nitrogen in co-implanted SiC. This and further evidence for defect aggregates underline the relevance of this motion. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:1281 / 1297
页数:17
相关论文
共 74 条
[1]   Clustering of vacancy defects in high-purity semi-insulating SiC [J].
Aavikko, R. ;
Saarinen, K. ;
Tuomisto, F. ;
Magnusson, B. ;
Son, N. T. ;
Janzen, E. .
PHYSICAL REVIEW B, 2007, 75 (08)
[2]   BISTABILITY AND METASTABILITY OF THE GALLIUM VACANCY IN GAAS - THE ACTUATOR OF EL2 [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW LETTERS, 1985, 55 (21) :2340-2343
[3]   Projector augmented wave method:: ab initio molecular dynamics with full wave functions [J].
Blöchl, PE ;
Först, CJ ;
Schimpl, J .
BULLETIN OF MATERIALS SCIENCE, 2003, 26 (01) :33-41
[4]   Kinetic mechanisms for the deactivation of nitrogen in SiC [J].
Bockstedte, M. ;
Mattausch, A. ;
Pankratov, O. .
SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2, 2006, 527-529 :621-+
[5]   Signature of the negative carbon vacancy-antisite complex [J].
Bockstedte, M. ;
Gali, A. ;
Umeda, T. ;
Son, N. T. ;
Isoya, J. ;
Janzen, E. .
SILICON CARBIDE AND RELATED MATERIALS 2005, PTS 1 AND 2, 2006, 527-529 :539-542
[6]   Different roles of carbon and silicon interstitials in the interstitial-mediated boron diffusion in SiC [J].
Bockstedte, M ;
Mattausch, A ;
Pankratov, O .
PHYSICAL REVIEW B, 2004, 70 (11) :115203-1
[7]   Signature of intrinsic defects in SiC:: Ab initio calculations of hyperfine tensors -: art. no. 193102 [J].
Bockstedte, M ;
Heid, M ;
Pankratov, O .
PHYSICAL REVIEW B, 2003, 67 (19)
[8]   Solubility of nitrogen and phosphorus in 4H-SiC: A theoretical study [J].
Bockstedte, M ;
Mattausch, A ;
Pankratov, O .
APPLIED PHYSICS LETTERS, 2004, 85 (01) :58-60
[9]   The nature and diffusion of intrinsic point defects in SiC [J].
Bockstedte, M ;
Heid, M ;
Mattausch, A ;
Pankratov, O .
SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 :471-476
[10]   Ab initio study of intrinsic point defects and dopant-defect complexes in SiC: Application to boron diffusion [J].
Bockstedte, M ;
Pankratov, O .
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 :949-952