Control of the degree of surface graphitization on 3C-SiC(100)/Si(100)

被引:15
作者
Gogneau, N. [1 ]
Balan, A. [2 ]
Ridene, M. [1 ]
Shukla, A. [2 ]
Ouerghi, A. [1 ]
机构
[1] CNRS LPN, F-91400 Marcoussis, France
[2] Univ Paris 06, CNRS IMPMC, F-75005 Paris, France
关键词
Epitaxial graphene layer; SiC; Leed; AFM; GRAPHENE; LAYERS;
D O I
10.1016/j.susc.2011.09.021
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The current method of growing graphene by thermal decomposition of 3C-SiC(100) on silicon substrates is technologically attractive. Here, we investigate the evolution of the surface graphitization as a function of the synthesis temperature. We establish that the carbon enrichment of the surface is characterized by a clear modulation of the surface potential and structuration. The structural properties analysis of the graphene layers by low energy electron diffraction and micro-Raman spectroscopy demonstrate a graphitization of the surface. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:217 / 220
页数:4
相关论文
共 31 条
[1]   Graphene Synthesis on Cubic SiC/Si Wafers. Perspectives for Mass Production of Graphene-Based Electronic Devices [J].
Aristov, Victor Yu. ;
Urbanik, Grzegorz ;
Kummer, Kurt ;
Vyalikh, Denis V. ;
Molodtsova, Olga V. ;
Preobrajenski, Alexei B. ;
Zakharov, Alexei A. ;
Hess, Christian ;
Haenke, Torben ;
Buechner, Bernd ;
Vobornik, Ivana ;
Fujii, Jun ;
Panaccione, Giancarlo ;
Ossipyan, Yuri A. ;
Knupfer, Martin .
NANO LETTERS, 2010, 10 (03) :992-995
[2]   Anodic bonded graphene [J].
Balan, Adrian ;
Kumar, Rakesh ;
Boukhicha, Mohamed ;
Beyssac, Olivier ;
Bouillard, Jean-Claude ;
Taverna, Dario ;
Sacks, William ;
Marangolo, Massimiliano ;
Lacaze, Emanuelle ;
Gohler, Roger ;
Escoffier, Walter ;
Poumirol, Jean-Marie ;
Shukla, Abhay .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2010, 43 (37)
[3]   Electronic confinement and coherence in patterned epitaxial graphene [J].
Berger, Claire ;
Song, Zhimin ;
Li, Xuebin ;
Wu, Xiaosong ;
Brown, Nate ;
Naud, Cecile ;
Mayou, Didier ;
Li, Tianbo ;
Hass, Joanna ;
Marchenkov, Atexei N. ;
Conrad, Edward H. ;
First, Phillip N. ;
de Heer, Wait A. .
SCIENCE, 2006, 312 (5777) :1191-1196
[4]   Raman fingerprint of charged impurities in graphene [J].
Casiraghi, C. ;
Pisana, S. ;
Novoselov, K. S. ;
Geim, A. K. ;
Ferrari, A. C. .
APPLIED PHYSICS LETTERS, 2007, 91 (23)
[5]   Large area quasi-free standing monolayer graphene on 3C-SiC(111) [J].
Coletti, C. ;
Emtsev, K. V. ;
Zakharov, A. A. ;
Ouisse, T. ;
Chaussende, D. ;
Starke, U. .
APPLIED PHYSICS LETTERS, 2011, 99 (08)
[6]   Surface Potentials and Layer Charge Distributions in Few-Layer Graphene Films [J].
Datta, Sujit S. ;
Strachan, Douglas R. ;
Mele, E. J. ;
Johnson, A. T. Charlie .
NANO LETTERS, 2009, 9 (01) :7-11
[7]  
Emtsev KV, 2009, NAT MATER, V8, P203, DOI [10.1038/nmat2382, 10.1038/NMAT2382]
[8]   Evidence of Structural Strain in Epitaxial Graphene Layers on 6H-SiC(0001) [J].
Ferralis, Nicola ;
Maboudian, Roya ;
Carraro, Carlo .
PHYSICAL REVIEW LETTERS, 2008, 101 (15)
[9]   Interpretation of Raman spectra of disordered and amorphous carbon [J].
Ferrari, AC ;
Robertson, J .
PHYSICAL REVIEW B, 2000, 61 (20) :14095-14107
[10]   Local work function measurements of epitaxial graphene [J].
Filleter, T. ;
Emtsev, K. V. ;
Seyller, Th. ;
Bennewitz, R. .
APPLIED PHYSICS LETTERS, 2008, 93 (13)