A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing

被引:28
作者
Arpaia, P [1 ]
Serra, AMD
Daponte, P
Monteiro, CL
机构
[1] Univ Naples Federico II, Dipartimento Ingn Elettr Polo Sci & Tecnol, Naples, Italy
[2] Inst Super Tecn, Dept Elect Engn & Comp, Inst Telecomunicacoes, Lisbon, Portugal
[3] Univ Sannio, Fac Ingn, Benevento, Italy
关键词
analog-to-digital converters; dynamic testing; nonlinearity; histogram test; hysteresis;
D O I
10.1109/19.948304
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years, the IEEE 1057-94 Standard [1] for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned scientific interest in several topics. In particular, investigations showed the histogram test of the standard to be insensitive to ADC hysteresis. In this paper, an alternative test procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits digital signal processing to reduce the large amount of data required by the histogram test. Numerical and experimental results of performance characterization, comparison with a state-of-the-art procedure, and noise-sensitivity analysis are presented and discussed.
引用
收藏
页码:941 / 948
页数:8
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