The detection of local plastic strain in microscopic scale

被引：7
|
作者：
Li, Jian [1 ]
机构：
[1] Canada Ctr Mineral & Energy Technol, Met Technol Labs, Ottawa, ON K1A 0G1, Canada
来源：
MATERIALS LETTERS | 2008年 / 62卷 / 6-7期
关键词：
plastic deformation; SEM; FIB;
D O I：
10.1016/j.matlet.2007.06.065
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The detection and evaluation of plastic deformation in microscopic scale is very important under many circumstances. The conventional optical and scanning-electron microscope (SEM) do not provide crystallographic contrast with sufficient sensitivity. Site-specific transmission-electron microscope (TEM) analyses are usually difficult due to the limited size of the area being analyzed and the difficulties in sample preparation. This paper will demonstrate that small plastically deformed zones can be easily detected using focused-ion beam (FIB) secondary-electron images. Crown Copyright (C) 2007 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码：804 / 807
页数：4
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