High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes

被引:28
作者
Barwood, GP [1 ]
Gill, P [1 ]
Rowley, WRC [1 ]
机构
[1] Natl Phys Lab, Ctr Length Metrol, Queens Rd, Teddington TW11 0LW, Middx, England
关键词
swept-frequency metrology; heterodyne interferometry; length metrology; laser diodes;
D O I
10.1088/0957-0233/9/7/005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The optical length of a 1 m Fabry-Perot etalon has been determined by swept-frequency interferometry using laser diodes. The method involves progressively building up the measurement accuracy using frequency sweeps over increasing ranges, from 150 MHz (one optical fringe) to 19 GHz and 7 THz. The 7 THz sweep is referenced to the splitting of the rubidium D lines at 780 nm and 795 nm. The result from the 7 THz sweep is sufficiently accurate to use the known frequency of either end point of the scan to determine the length to a few parts in 10(10), without the need for any further measurement. The scope for further development of this technique to a range of interferometric systems is discussed.
引用
收藏
页码:1036 / 1041
页数:6
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