High Reliability 808nm Laser Diodes With Output Power Over 19W Under CW Operation

被引:7
|
作者
Wang, Bangguo [1 ]
Tan, Shaoyang [2 ]
Zhou, Li [2 ]
Zhang, Zhicheng [1 ]
Xiao, Yao [1 ]
Liu, Wuling [1 ]
Gou, Yudan [1 ]
Deng, Guoliang [1 ]
Wang, Jun [1 ,2 ]
机构
[1] Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R China
[2] Suzhou Everbright Photon Co Ltd, Suzhou 215000, Peoples R China
关键词
Semiconductor devices; quantum well lasers; high power; 808nm; reliability; CONTINUOUS-WAVE POWER; EFFICIENCY;
D O I
10.1109/LPT.2022.3156913
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Compared to 9xxnm laser diodes emitting at 808nm are more prone to catastrophic optical mirror damage (COMD) and thermal rollover due to the shorter wavelength, resulting in lower device power. In this letter, we optimize a structure based on InGaAsP/InGaP to improve the conversion efficiency and use facet passivation to improve the COMD level. Laser diodes with 100 mu m emitter width and 5mm cavity length are fabricated. The continuous wave (CW) output power reaches 19W at 20A without COMD, which is the maximum CW state of art power reported so far for 808nm laser diodes. The slope efficiency reaches 1.28W/A and the maximum electro-optic conversion efficiency is 59.1%. The internal loss and internal quantum efficiency of the devices are 0.61cm(-1) and 98%, and the characteristic temperature T-0 and T-1 at high temperatures are 165K and 637K. The device can reliably work at 10A under 35 degrees heatsinks temperatures for over 2000h.
引用
收藏
页码:349 / 352
页数:4
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