The influence of the growth temperature and interruption time on the crystal quality of InGaAs/GaAs QW structures grown by MBE and MOCVD methods

被引：29

作者：

Jasik, A. ^{[1
]}

Wnuk, A. ^{[2
]}

Wojcik-Jedlinska, A. ^{[1
]}

Jakiela, R. ^{[2
,3
]}

Muszalski, J.

Strupinski, W. ^{[1
,2
]}

Bugajski, M. ^{[1
]}

机构：

[1] Inst Electr Mat Technol, PL-02668 Warsaw, Poland

[2] Inst Elect Mat Technol, PL-01919 Warsaw, Poland

[3] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

来源：

JOURNAL OF CRYSTAL GROWTH | 2008年 / 310卷 / 11期

关键词：

interfaces; roughening; quantum wells; MBE; MOCVD; semiconducting III-V materials;

D O I：

10.1016/j.jcrysgro.2008.02.018

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The impact of two technological parameters, i.e., the growth temperature and the interface growth interruption, on the crystal quality of strained InGaAs/GaAs quantum well (QW) structures was studied. The investigated heterostructures were grown by molecular beam epitaxy (MBE) and metalorganic chemical vapour deposition (MOCVD) under As-rich conditions. Photoluminescence (PL), reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM) were adopted for the evaluation of specified interfaces smoothness and the quality of layers. Comparison between both epitaxial techniques allowed us to find, that the growth temperature plays more significant role in the case of structures grown by MBE technique, whereas the quality of MOCVD grown structures is more sensitive to the growth interruption. Optimum values of the investigated parameters of QW crystallization were obtained for both growth techniques. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：2785 / 2792

页数：8

共 23 条

[1] Optical in-well pumping of a semiconductor disk laser with high optical efficiency [J].