Heterogeneous redundancy for fault and defect tolerance with complexity independent area overhead

被引:10
作者
Kumar, VV [1 ]
Lach, J [1 ]
机构
[1] Univ Virginia, Dept Elect & Comp Engn, Charlottesville, VA 22903 USA
来源
18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2003年
关键词
D O I
10.1109/DFTVS.2003.1250157
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The continuous increase in digital system complexity is raising the area cost of redundancy-based fault and defect tolerance. This paper introduces a technique for heterogeneous redundancy in control path and datapath circuitry that provides high reliability with area overhead that is independent of system complexity. Small amounts of circuit-specific reconfigurable logic are finely integrated with fixed-logic circuitry to provide fine-grained heterogeneous fault and defect tolerance. Results reveal that the technique is effective for a variety of circuits, providing high reliability with a constant magnitude area overhead that is independent of system complexity.
引用
收藏
页码:571 / 578
页数:8
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