Multifrequential AC modeling of the SThM probe behavior

被引：18

作者：

Grossel, Philippe ^{[1
]}

Raphaeel, Olivier ^{[1
]}

Depasse, Francoise ^{[1
]}

Duvaut, Thierry ^{[1
]}

Trannoy, Nathalie ^{[1
]}

机构：

[1] Univ Reims, Lab Engn & Opt, Unite Therm & Anal Phys, EA 3802, F-51687 Reims 2, France

来源：

INTERNATIONAL JOURNAL OF THERMAL SCIENCES | 2007年 / 46卷 / 10期

关键词：

scanning thermal microscopy; 3 omega method; thermal modeling;

D O I：

10.1016/j.ijthermalsci.2006.12.004

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

The scanning thermal microscope is of current use for the determination of the thermal conductivity of material surfaces, with a submicrometer resolution. The determination of the parameters that have great importance in the probe response is clarified and an analytical approach in the multifrequency domain is compared with a finite element method and experimental results without contact. (c) 2007 Elsevier Masson SAS. All rights reserved.

引用

页码：980 / 988

页数：9

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