Decoupling a Cooper-Pair Box to Enhance the Lifetime to 0.2 ms

被引：60

作者：

Kim, Z. ^{[1
,2
]}

Suri, B. ^{[1
,2
]}

Zaretskey, V. ^{[1
,2
]}

Novikov, S. ^{[1
,2
]}

Osborn, K. D. ^{[1
]}

Mizel, A. ^{[1
]}

Wellstood, F. C. ^{[2
,3
,4
]}

Palmer, B. S. ^{[1
]}

机构：

[1] Lab Phys Sci, College Pk, MD 20740 USA

[2] Univ Maryland, Dept Phys, College Pk, MD 20742 USA

[3] Joint Quantum Inst, College Pk, MD 20742 USA

[4] Ctr Nanophys & Adv Mat, College Pk, MD 20742 USA

来源：

PHYSICAL REVIEW LETTERS | 2011年 / 106卷 / 12期

关键词：

SINGLE-ELECTRON TRANSISTORS; NOISE; CIRCUIT;

D O I：

10.1103/PhysRevLett.106.120501

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present results on a circuit QED experiment in which a separate transmission line is used to address a quasilumped element superconducting microwave resonator which is in turn coupled to an Al/AlO(x)/Al Cooper-pair box charge qubit. With our device, we find a strong correlation between the lifetime of the qubit and the inverse of the coupling between the qubit and the transmission line. At the smallest coupling we measured, the lifetime of the Cooper-pair box was T(1) = 200 mu s, which represents more than a twentyfold improvement in the lifetime of the Cooper-pair box compared with previous results. These results imply that the loss tangent in the AlO(x) junction barrier must be less than about 4 X 10(-8) at 4.5 GHz, about 4 orders of magnitude less than reported in larger area Al/AlO(x)/Al tunnel junctions.

引用

页数：4

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