Characterization of micromachined CMOS transmission lines for RF communications

被引:0
|
作者
Ozgur, M [1 ]
Milanovic, V [1 ]
Zincke, C [1 ]
Zaghloul, ME [1 ]
机构
[1] George Washington Univ, Dept Elect Engn & Comp Sci, Washington, DC 20052 USA
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暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This work reports on the analytical and experimental characterization of micromachined microwave transmission lines used in RF communication applications. New analytic approximations are derived for the quasi-static capacitance of coplanar transmission lines with finite metalization thickness. The expressions are well suited for CAD applications since they are compact and scalable. Furthermore, their accuracy is comparable with the fabrication tolerances and measurement accuracy achievable.
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收藏
页码:C353 / C356
页数:4
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