Far-infrared dielectric constant of porous silicon layers measured by terahertz time-domain spectroscopy

被引：36

作者：

Labbe-Lavigne, S ^{[1
]}

Barret, S

Garet, F

Duvillaret, L

Coutaz, JL

机构：

[1] Univ Savoie, Lab Hyperfrequences & Caracterisat, F-73376 Le Bourget Lac, France

[2] Univ Grenoble 1, Spectrometrie Phys Lab, CNRS, UMR 5588, F-38402 St Martin Dheres, France

来源：

JOURNAL OF APPLIED PHYSICS | 1998年 / 83卷 / 11期

关键词：

D O I：

10.1063/1.367467

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We measure the refractive index and the absorption of porous silicon layers in the millimetric and submillimetric wavelength range using the terahertz time-domain spectroscopy technique. For the studied range of porosity (55%-76%), the refractive index of porous silicon is rather well described by mixture theories, in which the refractive index of bulk silicon enters as a main parameter. (C) 1998 American Institute of Physics. [S0021-8979(98)07311-3].

引用

页码：6007 / 6010

页数：4

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