Electroluminescence from Au/extra-thin Si-rich SiO2 film/n+-Si under reverse biases and its mechanism

被引:8
作者
Li, AP
Bai, GF
Chen, KM
Ma, ZC
Zong, WH
Zhang, YX
Qin, GG [1 ]
机构
[1] Beijing Univ, Dept Phys, Beijing 100871, Peoples R China
[2] 13th Inst Minist Elect Ind, Natl Lab GaAs IC, Shijiazhuang 050051, Peoples R China
基金
中国国家自然科学基金;
关键词
luminescence; silicon oxide; gold; structural properties;
D O I
10.1016/S0040-6090(98)00511-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have fabricated Au/extra-thin Si-rich SiO2 (ETSSO) film/p-Si and Au/ETSSO/n(+)-Si structures and compared their electroluminescence (EL) characteristics. It is found that for the Au/ETSSO/p-Si structure, when the forward bias (a positive voltage is applied to the p-Si substrate with respect to the Au electrode) is larger than 4 V, red light emission is observed, while under bias reverses, no light is emitted. The Au/ETSSO/n(+)-Si structure does not emit light under the forward bias (a positive voltage is applied to the Au electrode with respect to the n(+)-Si substrate), but it emits red light when the reverse bias is greater than a critical value, which correlates with the thickness of the ETSSO film. We have suggested a model for the electroluminescence mechanism of Au/ETSSO/n+-Si structures. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:137 / 139
页数:3
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