Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy

被引:74
作者
Suzuki, Kazuhiro [1 ]
Oyabu, Noriaki [1 ,2 ]
Kobayashi, Kei [3 ]
Matsushige, Kazumi [1 ]
Yamada, Hirofumi [1 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6158510, Japan
[2] Japan Sci & Technol Agcy, Kawaguchi, Saitama 3320012, Japan
[3] Kyoto Univ, Off Society Acad Collaborat Innovat, Kyoto 6158520, Japan
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
ENERGY; LIQUID; DYNAMICS; SURFACES;
D O I
10.1143/APEX.4.125102
中图分类号
O59 [应用物理学];
学科分类号
摘要
Atomic-resolution images of a graphite (0001) surface in water were successfully obtained by frequency modulation atomic force microscopy. Atomic scale features with a periodicity of 0.25 nm were resolved with an interaction force of less than 100 pN using a stiff cantilever and a very small oscillation amplitude of 0.11 nm (0.21 nm peak-to-peak). Furthermore, structured-water layers on a hydrophobic graphite surface were visualized by two-dimensional frequency shift mapping. The results were compared with a molecular-scale hydration structure at an interface between a hydrophilic mica surface and water. (C) 2011 The Japan Society of Applied Physics
引用
收藏
页数:3
相关论文
共 26 条
[1]  
Albers BJ, 2009, NAT NANOTECHNOL, V4, P307, DOI [10.1038/NNANO.2009.57, 10.1038/nnano.2009.57]
[2]   ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602
[3]   Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001) [J].
Allers, W ;
Schwarz, A ;
Schwarz, UD ;
Wiesendanger, R .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :247-252
[4]   Molecular structure and dynamics in thin water films at the silica and graphite surfaces [J].
Argyris, Dimitrios ;
Tummala, Naga Rajesh ;
Striolo, Alberto ;
Cole, David R. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2008, 112 (35) :13587-13599
[5]   ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
GERBER, C ;
STOLL, E ;
ALBRECHT, TR ;
QUATE, CF .
SURFACE SCIENCE, 1987, 189 :1-6
[6]   Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy [J].
Fukuma, T ;
Kimura, M ;
Kobayashi, K ;
Matsushige, K ;
Yamada, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (05)
[7]   True atomic resolution in liquid by frequency-modulation atomic force microscopy [J].
Fukuma, T ;
Kobayashi, K ;
Matsushige, K ;
Yamada, H .
APPLIED PHYSICS LETTERS, 2005, 87 (03)
[8]   Atomic-Scale Distribution of Water Molecules at the Mica-Water Interface Visualized by Three-Dimensional Scanning Force Microscopy [J].
Fukuma, Takeshi ;
Ueda, Yasumasa ;
Yoshioka, Shunsuke ;
Asakawa, Hitoshi .
PHYSICAL REVIEW LETTERS, 2010, 104 (01)
[9]   Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite [J].
Hembacher, S ;
Giessibl, FJ ;
Mannhart, J ;
Quate, CF .
PHYSICAL REVIEW LETTERS, 2005, 94 (05)
[10]   WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].
Horcas, I. ;
Fernandez, R. ;
Gomez-Rodriguez, J. M. ;
Colchero, J. ;
Gomez-Herrero, J. ;
Baro, A. M. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)