Diagnostics of Nanostructured States of Materials after Strong External Exposures by Atom Probe Methods of Field Ion Microscopy

被引：0
作者：
Ivchenko, V. A. [1 ]
机构：
[1] Russian Acad Sci, Inst Electrophys, Ural Branch, Ekaterinburg 620016, Russia
来源：
INORGANIC MATERIALS | 2011年 / 47卷 / 15期
关键词：
field ion microscopy; FIM atom probes; nanostructured states; metals; alloys; ion bombardment; SUBSURFACE VOLUME; ALLOY; FIM;
D O I：
10.1134/S0020168511150076
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Modifications of the structure of metal materials after strong external exposures are studied in the nanometer range using field ion microscopy (FIM) and FIM atom probes. The essence of the method, device operation principle, and experimental techniques are briefly characterized. The possibility of three-dimensional reconstruction of the elemental composition of studied materials with atomic resolution is shown by original results.
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页码：1655 / 1662
页数：8
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