Electromagnetic Emission Modeling in Case of Shielded Cabling With Respect to the Ground Dielectric Properties

被引:12
作者
Baklezos, Anargyros T. [1 ]
Nikolopoulos, Christos D. [1 ]
Katsouris, Adrianos G. [1 ]
Koutantos, Grigoris I. [1 ]
Capsalis, Christos N. [1 ]
机构
[1] Natl Tech Univ Athens, Athens 15780, Greece
关键词
Contributing phenomena decomposition; electric field measurements; electromagnetic (EM) emission modeling; genetic algorithms; grounding; SELECTIVE VALIDATION FSV; RADIATED EMISSIONS; CABLES; CEM;
D O I
10.1109/TEMC.2016.2588583
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Satellites and spacecraft subsystems in general are vulnerable in terms of electromagnetic interference. Shielded cables, connecting these subsystems as well as the subsystems themselves, are major sources of electromagnetic (EM) emission. The minimization of these emissions is critical in order to achieve EM cleanliness. An accurate model predicting these emissions could offer great insight and enable interference minimization. In this study, a shielded cable model for predicting EM emission via decomposition of contributing phenomena is presented including the ground dielectric properties. The model is built based on a standardized measurement setup and validated for different cases of ground material and cable's position.
引用
收藏
页码:1694 / 1700
页数:7
相关论文
共 15 条
[1]  
[Anonymous], ECSSE4012A
[2]  
[Anonymous], 2012, ANTENNA THEORY ANAL
[3]  
[Anonymous], P1597 IEEE
[4]  
[Anonymous], THEORY ELECTROMAGNET
[5]  
[Anonymous], ESA
[6]  
[Anonymous], ECSSEST2007
[7]   Feature selective validation (FSV) for validation of computational electromagnetics (CEM). Part I - The FSV method [J].
Duffy, Alistair P. ;
Martin, Anthony J. M. ;
Orlandi, Antonio ;
Antonini, Giulio ;
Benson, Trevor M. ;
Woolfson, Malcolm S. .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2006, 48 (03) :449-459
[8]   RADIATED EMISSION FROM SHIELDED CABLES BY PIGTAIL EFFECT [J].
HAN, F .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1992, 34 (03) :345-348
[9]  
JIA J, 2012, P 2012 AS PAC SIGN I, P1
[10]  
Li GH, 2013, IEEE INT SYMP ELEC, P626, DOI 10.1109/ISEMC.2013.6670487