Ferroelastic fatigue of a soft PZT ceramic

被引:19
作者
Jones, JL [1 ]
Salz, CRJ [1 ]
Hoffman, M [1 ]
机构
[1] Univ New S Wales, Sydney, NSW 2036, Australia
关键词
D O I
10.1111/j.1551-2916.2005.00520.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The performance and expected lifetime of piezoelectric ceramic components are ultimately defined by bulk material fatigue processes. In this work, strain accumulation of a ferroelectric/ferroelastic ceramic lead zirconate titanate is characterized under mechanical cycling using four-point bend bar geometry. Strain accumulation occurs at a higher rate than in creep alone, indicating that the processes are fatigue related, and it is conformed by X-ray diffraction that the accumulated strain is contributed under both cyclic tensile and compressive stress by domain switching. The relative ranking of measured mechanical strains is nearly the same as the theoretical saturated domain-switching strains.
引用
收藏
页码:2788 / 2792
页数:5
相关论文
共 18 条
[1]   Stress dependence of reversible and irreversible domain switching in PZT during cyclic loading [J].
Calderon-Moreno, JM ;
Popa, M .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 336 (1-2) :124-128
[2]  
Cheary RW, 1996, PROGRAMS XFIT FOURYA
[3]   Determination of room-temperature tensile creep of PZT [J].
Fett, T ;
Thun, G .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1998, 17 (22) :1929-1931
[4]   Strength of a soft PZT ceramic under a transverse electric field [J].
Fett, T ;
Munz, D ;
Thun, G .
JOURNAL OF MATERIALS SCIENCE LETTERS, 2000, 19 (21) :1921-1924
[5]  
Fett T, 1998, J AM CERAM SOC, V81, P269, DOI 10.1111/j.1151-2916.1998.tb02332.x
[6]  
Fett T, 2000, J TEST EVAL, V28, P27, DOI 10.1520/JTE12071J
[7]   Ferroelastic switching in a soft lead zirconate titanate [J].
Forrester, JS ;
Kisi, EH .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2004, 24 (03) :595-602
[8]  
Jaffe B., 1971, Piezoelectric Ceramics
[9]   Domain texture distributions in tetragonal lead zirconate titanate by x-ray and neutron diffraction [J].
Jones, JL ;
Slamovich, EB ;
Bowman, KJ .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (03)
[10]  
JONES JL, 2005, IN PRESS J APPL PHYS