CHARACTERIZATION OF HIGH-PHOTOCURRENT AND HIGH-SPEED INP-BASED UNI-TRAVELING-CARRIER PHOTODIODES AT 1.55-μm WAVELENGTH

被引:2
作者
Meng, Qianqian [1 ]
Wang, Hong [1 ,2 ]
Liu, Chongyang [1 ]
Gao, Jianjun [3 ]
Tian, Yang [1 ]
Ang, Kian Siong [1 ]
Guo, Xin [1 ]
Gao, Bo [4 ]
机构
[1] Nanyang Technol Univ, Temasek Labs NTU TL NTU, 50 Nanyang Dr, Singapore 637553, Singapore
[2] Nanyang Technol Univ, Sch Elect & Elect Engn, Nanyang Ave, Singapore 639798, Singapore
[3] East China Normal Univ, Sch Informat Sci & Technol, Shanghai 200262, Peoples R China
[4] Xi An Jiao Tong Univ, Sch Elect & Informat Engn, 28 Xianning West Rd, Xian 710049, Shaanxi, Peoples R China
基金
新加坡国家研究基金会;
关键词
uni-traveling-carrier photodiodes; dipole-doped structure; parameter extraction; frequency response; 3-dB bandwidth; PARAMETER-EXTRACTION METHOD; EQUIVALENT-CIRCUIT MODEL; I-N PHOTODIODES; QUANTUM-WELL LASER;
D O I
10.1002/mop.29997
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate a semi-analytical parameter extraction method to characterize high-speed and high-photocurrent InP-based unitraveling- carrier photodiodes with dipole-doped structure. The accuracy of proposed method has been validated with good agreements between the measured and simulated results of reflection coefficients and frequency responses in a wide frequency range up to 40 GHz. (C) 2016 Wiley Periodicals, Inc.
引用
收藏
页码:2156 / 2162
页数:8
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