Characterization of the effects of silicon on the formation of goethite

被引：16

作者：

Gomez, J. A. Mejia ^{[1
,2
]}

de Resende, V. G.

Antonissen, J. ^{[2
]}

De Grave, E.

机构：

[1] Univ Ghent, Dept Phys & Astron, Div NUMAT, B-9000 Ghent, Belgium

[2] Arcelor Mittal Res Ind Gent ARIG, B-9060 Zelzate, Belgium

来源：

CORROSION SCIENCE | 2011年 / 53卷 / 05期

关键词：

Goethite; Silicon; Characterization; Growth inhibition; Particle size; ALPHA-FEOOH PARTICLES; MAGNETIC-PROPERTIES; RUST LAYER; MORPHOLOGY; STEEL; IONS;

D O I：

10.1016/j.corsci.2011.01.053

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Goethite samples were synthesised with different sodium silicate concentrations (0, 10(-5),10(-4),10(-3) and 10(-2) M) in the initial aqueous solution. X-ray diffraction (XRD), Mossbauer spectrometry, inductively coupled plasma mass spectrometry (ICP-MS) and transmission electron microscopy (TEM) were used to investigate the influence of Si content on the formation and physical characteristics of goethite. Mossbauer spectroscopy and TEM results demonstrate that the particle size changes as the sodium silicate content increases. XRD results (lattice parameters, line width and mean coherence length values) do not show any indication that Si species would substitute for Fe in the goethite structure. (c) 2011 Elsevier Ltd. All rights reserved.

引用

页码：1756 / 1761

页数：6

共 21 条

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