Photoelectric effect at ultrahigh intensities

被引:222
作者
Sorokin, A. A.
Bobashev, S. V.
Feigl, T.
Tiedtke, K.
Wabnitz, H.
Richter, M.
机构
[1] Phys Tech Bundesanstalt, D-10587 Berlin, Germany
[2] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[3] Fraunhofer Inst Ang Opt Feinm, D-07745 Jena, Germany
[4] Deutsches Elektronen Synchrontron DESY, D-22603 Hamburg, Germany
关键词
D O I
10.1103/PhysRevLett.99.213002
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In the spectral range of the extreme ultraviolet at a wavelength of 13.3 nm, we have studied the photoionization of xenon at ultrahigh intensities. For our ion mass-to-charge spectroscopy experiments, irradiance levels from 10(12) to 10(16) Wcm(-2) were achieved at the new free-electron laser in Hamburg FLASH by strong beam focusing with the aid of a spherical multilayer mirror. Ion charges up to Xe21+ were observed and investigated as a function of irradiance. Our surprising results are discussed in terms of a perturbative and nonperturbative description.
引用
收藏
页数:4
相关论文
共 29 条
  • [1] Operation of a free-electron laser from the extreme ultraviolet to the water window
    Ackermann, W.
    Asova, G.
    Ayvazyan, V.
    Azima, A.
    Baboi, N.
    Baehr, J.
    Balandin, V.
    Beutner, B.
    Brandt, A.
    Bolzmann, A.
    Brinkmann, R.
    Brovko, O. I.
    Castellano, M.
    Castro, P.
    Catani, L.
    Chiadroni, E.
    Choroba, S.
    Cianchi, A.
    Costello, J. T.
    Cubaynes, D.
    Dardis, J.
    Decking, W.
    Delsim-Hashemi, H.
    Delserieys, A.
    Di Pirro, G.
    Dohlus, M.
    Duesterer, S.
    Eckhardt, A.
    Edwards, H. T.
    Faatz, B.
    Feldhaus, J.
    Floettmann, K.
    Frisch, J.
    Froehlich, L.
    Garvey, T.
    Gensch, U.
    Gerth, Ch.
    Goerler, M.
    Golubeva, N.
    Grabosch, H.-J.
    Grecki, M.
    Grimm, O.
    Hacker, K.
    Hahn, U.
    Han, J. H.
    Honkavaara, K.
    Hott, T.
    Huening, M.
    Ivanisenko, Y.
    Jaeschke, E.
    [J]. NATURE PHOTONICS, 2007, 1 (06) : 336 - 342
  • [2] Absolute photoionization cross sections for Xe4+, Xe5+, and Xe6+ near 13.5 nm:: Experiment and theory
    Aguilar, A
    Gillaspy, JD
    Gribakin, GF
    Phaneuf, RA
    Gharaibeh, MF
    Kozlov, MG
    Bozek, JD
    Kilcoyne, ALD
    [J]. PHYSICAL REVIEW A, 2006, 73 (03):
  • [3] Absolute cross sections for the photoionization of 4d electrons in Xe+ and Xe2+ ions
    Andersen, P
    Andersen, T
    Folkmann, F
    Ivanov, VK
    Kjeldsen, H
    West, JB
    [J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2001, 34 (10) : 2009 - 2019
  • [4] First operation of a free-electron laser generating GW power radiation at 32 nm wavelength
    Ayvazyan, V
    Baboi, N
    Bähr, J
    Balandin, V
    Beutner, B
    Brandt, A
    Bohnet, I
    Bolzmann, A
    Brinkmann, R
    Brovko, OI
    Carneiro, JP
    Casalbuoni, S
    Castellano, M
    Castro, P
    Catani, L
    Chiadroni, E
    Choroba, S
    Cianchi, A
    Delsim-Hashemi, H
    Di Pirro, G
    Dohlus, M
    Düsterer, S
    Edwards, HT
    Faatz, B
    Fateev, AA
    Feldhaus, J
    Flöttmann, K
    Frisch, J
    Fröhlich, L
    Garvey, T
    Gensch, U
    Golubeva, N
    Grabosch, HJ
    Grigoryan, B
    Grimm, O
    Hahn, U
    Han, JH
    Hartrott, MV
    Honkavaara, K
    Hüning, M
    Ischebeck, R
    Jaeschke, E
    Jablonka, M
    Kammering, R
    Katalev, V
    Keitel, B
    Khodyachykh, S
    Kim, Y
    Kocharyan, V
    Körfer, M
    [J]. EUROPEAN PHYSICAL JOURNAL D, 2006, 37 (02) : 297 - 303
  • [5] Two-photon double ionization of rare gases by a superposition of harmonics
    Benis, E. P.
    Charalambidis, D.
    Kitsopoulos, T. N.
    Tsakiris, G. D.
    Tzallas, P.
    [J]. PHYSICAL REVIEW A, 2006, 74 (05):
  • [6] Absolute photoionization cross sections along the Xe isonuclear sequence:: Xe3+ to Xe6+
    Bizau, JM
    Blancard, C
    Cubaynes, D
    Folkmann, F
    Champeaux, JP
    Lemaire, JL
    Wuilleumier, FJ
    [J]. PHYSICAL REVIEW A, 2006, 73 (02): : 1 - 15
  • [7] Delone N. B., 2000, MULTIPHOTON PROCESSE
  • [8] Einstein A, 1905, ANN PHYS-BERLIN, V17, P132
  • [9] Photoionization and electron-impact ionization of Xe3+ -: art. no. 042704
    Emmons, ED
    Aguilar, A
    Gharaibeh, MF
    Scully, SWJ
    Phaneuf, RA
    Kilcoyne, ALD
    Schlachter, AS
    Alvarez, I
    Cisneros, C
    Hinojosa, G
    [J]. PHYSICAL REVIEW A, 2005, 71 (04):
  • [10] EUV multilayer optics
    Feigl, T
    Yulin, S
    Benoit, N
    Kaiser, N
    [J]. MICROELECTRONIC ENGINEERING, 2006, 83 (4-9) : 703 - 706