Temporal phase unwrapping using deep learning

被引:126
作者
Yin, Wei [1 ,2 ,3 ]
Chen, Qian [1 ,2 ]
Feng, Shijie [1 ,2 ,3 ]
Tao, Tianyang [1 ,2 ,3 ]
Huang, Lei [4 ]
Trusiak, Maciej [5 ]
Asundi, Anand [6 ]
Zuo, Chao [1 ,2 ,3 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Elect & Opt Engn, 200 Xiaolingwei St, Nanjing 210094, Jiangsu, Peoples R China
[2] Nanjing Univ Sci & Technol, Jiangsu Key Lab Spectral Imaging & Intelligent Se, Nanjing 210094, Jiangsu, Peoples R China
[3] Nanjing Univ Sci & Technol, Smart Computat Imaging SCI Lab, Nanjing 210094, Jiangsu, Peoples R China
[4] Brookhaven Natl Lab, NSLS 2 50 Rutherford Dr, Upton, NY 11973 USA
[5] Warsaw Univ Technol, Inst Micromech & Photon, 8 Sw A Boboli St, PL-02525 Warsaw, Poland
[6] Nanyang Technol Univ, Sch Mech & Aerosp Engn, COLE, Singapore 639798, Singapore
基金
中国国家自然科学基金; 国家重点研发计划; 中国博士后科学基金;
关键词
3D SHAPE MEASUREMENT; FOURIER-TRANSFORM PROFILOMETRY; FRINGE PROJECTION PROFILOMETRY; ALGORITHMS; FREQUENCY; PATTERNS;
D O I
10.1038/s41598-019-56222-3
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The multi-frequency temporal phase unwrapping (MF-TPU) method, as a classical phase unwrapping algorithm for fringe projection techniques, has the ability to eliminate the phase ambiguities even while measuring spatially isolated scenes or the objects with discontinuous surfaces. For the simplest and most efficient case in MF-TPU, two groups of phase-shifting fringe patterns with different frequencies are used: the high-frequency one is applied for 3D reconstruction of the tested object and the unit-frequency one is used to assist phase unwrapping for the wrapped phase with high frequency. The final measurement precision or sensitivity is determined by the number of fringes used within the high-frequency pattern, under the precondition that its absolute phase can be successfully recovered without any fringe order errors. However, due to the non-negligible noises and other error sources in actual measurement, the frequency of the high-frequency fringes is generally restricted to about 16, resulting in limited measurement accuracy. On the other hand, using additional intermediate sets of fringe patterns can unwrap the phase with higher frequency, but at the expense of a prolonged pattern sequence. With recent developments and advancements of machine learning for computer vision and computational imaging, it can be demonstrated in this work that deep learning techniques can automatically realize TPU through supervised learning, as called deep learning-based temporal phase unwrapping (DL-TPU), which can substantially improve the unwrapping reliability compared with MF-TPU even under different types of error sources, e.g., intensity noise, low fringe modulation, projector nonlinearity, and motion artifacts. Furthermore, as far as we know, our method was demonstrated experimentally that the high-frequency phase with 64 periods can be directly and reliably unwrapped from one unit-frequency phase using DL-TPU. These results highlight that challenging issues in optical metrology can be potentially overcome through machine learning, opening new avenues to design powerful and extremely accurate high-speed 3D imaging systems ubiquitous in nowadays science, industry, and multimedia.
引用
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页数:12
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