X-ray diffraction characterization of the superficial attack of cement pastes in sulfate solutions
被引:2
作者:
Jauberthie, R
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机构:INSA, Lab GTMa, F-35043 Rennes, France
Jauberthie, R
Robu, I
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h-index: 0
机构:INSA, Lab GTMa, F-35043 Rennes, France
Robu, I
Lanos, C
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h-index: 0
机构:INSA, Lab GTMa, F-35043 Rennes, France
Lanos, C
Mortreuil, F
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h-index: 0
机构:INSA, Lab GTMa, F-35043 Rennes, France
Mortreuil, F
Camps, JP
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h-index: 0
机构:INSA, Lab GTMa, F-35043 Rennes, France
Camps, JP
机构:
[1] INSA, Lab GTMa, F-35043 Rennes, France
[2] Univ Tech Construct Bucarest, Bucharest, Romania
来源:
JOURNAL DE PHYSIQUE IV
|
1998年
/
8卷
/
P5期
关键词:
D O I:
10.1051/jp4:1998566
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
Samples of cement pastes were submitted to sulphatic attack. The X ray diffraction analysis of their surfaces allowed the identification and the location of the different phases present through the alteration thickness. So it was confirmed that a thin film of ettringite arises between crystallised gypsum, on the surface, and the unattacked zone of the hydrated cement bulk. This phase profile explains the kinetic of the process which varies according to the acidity of the aggressive agent. It must be underlined that this layer is thin and that it can constitute a protective barrier against further corrosion. Therefore, the size of the corroded area depends on the surface roughness. It will increase with the micro-porosity or the micro-cracking of the cement paste.