Image contrast reversals in contact resonance atomic force microscopy

被引：12

作者：

Ma, Chengfu ^{[1
]}

Chen, Yuhang ^{[1
]}

Wang, Tian ^{[1
]}

机构：

[1] Univ Sci & Technol China, Dept Precis Machinery & Precis Instrumentat, Hefei 230026, Anhui, Peoples R China

来源：

AIP ADVANCES | 2015年 / 5卷 / 02期

基金：

中国国家自然科学基金;

关键词：

ACOUSTIC MICROSCOPY; ULTRASONIC FREQUENCIES; ELASTIC PROPERTIES; AFM;

D O I：

10.1063/1.4908037

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered. (C) 2015 Author(s).

引用

收藏

页数：6

相关论文

共 28 条

[1] Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy [J].

Amelio, S ;

Goldade, AV ;

Rabe, U ;

Scherer, V ;

Bhushan, B ;

Arnold, W .

THIN SOLID FILMS, 2001, 392 (01) :75-84

[2] Observation of local internal friction and plasticity onset in nanocrystalline nickel by atomic force acoustic microscopy [J].

Caron, A. ;

Arnold, W. .

ACTA MATERIALIA, 2009, 57 (15) :4353-4363

[3] SCANNING MICRODEFORMATION MICROSCOPY [J].

CRETIN, B ;

STHAL, F .

APPLIED PHYSICS LETTERS, 1993, 62 (08) :829-831

[4] Thin film characterization by atomic force microscopy at ultrasonic frequencies [J].

Crozier, KB ;

Yaralioglu, GG ;

Degertekin, FL ;

Adams, JD ;

Minne, SC ;

Quate, CF .

APPLIED PHYSICS LETTERS, 2000, 76 (14) :1950-1952

[5] Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies [J].

Cuberes, MT ;

Assender, HE ;

Briggs, GAD ;

Kolosov, OV .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (19) :2347-2355

[6] Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy [J].

Dinelli, F ;

Biswas, SK ;

Briggs, GAD ;

Kolosov, OV .

PHYSICAL REVIEW B, 2000, 61 (20) :13995-14006

[7] Dynamic atomic force microscopy methods [J].

García, R ;

Pérez, R .

SURFACE SCIENCE REPORTS, 2002, 47 (6-8) :197-301

[8] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].

Horcas, I. ;

Fernandez, R. ;

Gomez-Rodriguez, J. M. ;

Colchero, J. ;

Gomez-Herrero, J. ;

Baro, A. M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)

[9] AFM and acoustics: Fast, quantitative nanomechanical mapping [J].

Huey, Bryan D. .

ANNUAL REVIEW OF MATERIALS RESEARCH, 2007, 37 :351-385

[10] Mapping mechanical properties on the nanoscale using atomic-force acoustic microscopy [J].

Hurley, D. C. ;

Kopycinska-Muller, M. ;

Kos, A. B. .

JOM, 2007, 59 (01) :23-29