Final report on the APMP comparison of capacitance at 100 pF (APMP supplementary comparison APMP.EM-S7)

被引：5

作者：

Johnson, Leigh ^{[1
]}

Chua, Wey ^{[2
]}

Corney, Andrew ^{[3
]}

Hsu, Jimmy ^{[4
]}

Sardjono, Hadi ^{[5
]}

Lee, Rae Duk ^{[6
]}

Zhang Zhonghua ^{[7
]}

Charoensook, Ajchara ^{[8
]}

Coogan, Peter ^{[1
]}

Nakamura, Yasuhiro ^{[9
]}

Moodley, Alan

Saxena, A. K.

Yan, Y. K.

Abidin, Abdul Rashid Bin Zainal

Lee, Jinni

Semenov, Yuri

机构：

[1] Natl Measurement Inst, Lindfield, NSW 2070, Australia

[2] Stand Prod & Innovat Board, Singapore, Singapore

[3] Ind Res Ltd, Measurement Stand Lab, Lower Hutt, New Zealand

[4] Ctr Measurement Stand, Hsinchu, Taiwan

[5] PUSLIT KIM LIPI, Serpong, Tangerang, Indonesia

[6] Korea Res Inst Stand & Sci, Yusong, Daejeon, South Korea

[7] Natl Inst Metrol, Beijing, Peoples R China

[8] Natl Inst Metrol Thailand, Bangkok, Thailand

[9] Natl Metrol Inst Japan, Tsukuba, Ibaraki, Japan

来源：

关键词：

D O I：

10.1088/0026-1394/45/1A/01003

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页数：3