A method to improve spectral resolution in planar semiconductor gamma-ray detectors

被引:9
|
作者
Keele, BD [1 ]
Addleman, RS [1 ]
Troyer, GL [1 ]
机构
[1] WESTINGHOUSE HANFORD CO,RICHLAND,WA 99352
关键词
D O I
10.1109/23.507066
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes an empirically derived algorithm to compensate for charge trapping in CdTe, CdZnTe, and other planar semiconductor detectors. The method is demonstrated to be an improvement over available systems, and application to experimental data is shown.
引用
收藏
页码:1365 / 1368
页数:4
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