An Investigation into the Optimum Thickness of Titanium Dioxide Thin Films Synthesized by Using Atmospheric Pressure Chemical Vapour Deposition for Use in Photocatalytic Water Oxidation
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作者:
Hyett, Geoffrey
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UCL, Christopher Ingold Lab, London WC1H 0AJ, EnglandUCL, Christopher Ingold Lab, London WC1H 0AJ, England
Hyett, Geoffrey
[1
]
Darr, Jawwad A.
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UCL, Christopher Ingold Lab, London WC1H 0AJ, EnglandUCL, Christopher Ingold Lab, London WC1H 0AJ, England
Darr, Jawwad A.
[1
]
Mills, Andrew
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Univ Strathclyde, Dept Pure & Appl Chem, Glasgow G1 1XL, Lanark, ScotlandUCL, Christopher Ingold Lab, London WC1H 0AJ, England
Mills, Andrew
[2
]
Parkin, Ivan P.
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UCL, Christopher Ingold Lab, London WC1H 0AJ, EnglandUCL, Christopher Ingold Lab, London WC1H 0AJ, England
Parkin, Ivan P.
[1
]
机构:
[1] UCL, Christopher Ingold Lab, London WC1H 0AJ, England
Twenty eight films of titanium dioxide of varying thickness were synthesised by using atmospheric pressure chemical vapour deposition (CVD) of titanium(IV) chloride and ethyl acetate onto glass and titanium substrates. Fixed reaction conditions at a substrate temperature of 660 degrees C were used for all depositions, with varying deposition times of 5-60 seconds used to control the thickness of the samples. A sacrificial electron acceptor system composed of alkaline sodium persulfate was used to determine the rate at which these films could photo-oxidise water in the presence of 365 nm light. The results of this work showed that the optimum thickness for CVD films on titanium substrates for the purposes of water oxidation was approximate to 200 nm, and that a platinum coating on the reverse of such samples leads to a five-fold increase in the observed rate of water oxidation.