Spectral characterization of two-dimensional Thue-Morse quasicrystals realized with high resolution lithography

被引:25
作者
Matarazzo, V. [1 ]
De Nicola, S. [2 ]
Zito, G. [1 ]
Mormile, P. [1 ]
Rippa, M. [1 ]
Abbate, G. [3 ,4 ]
Zhou, J. [5 ]
Petti, L. [1 ]
机构
[1] CNR, Ist Cibernet E Caianiello, I-80078 Pozzuoli, Na, Italy
[2] CNR, Ist Nazl Ott, I-80078 Pozzuoli, Na, Italy
[3] Univ Naples Federico 2, CNR SPIN, I-80126 Naples, Italy
[4] Univ Naples Federico 2, Dept Phys, I-80126 Naples, Italy
[5] Univ Ningbo City, Photon Inst, Ningbo City, Zhejiang, Peoples R China
关键词
photonic quasicrystals; electron-beam lithography; PHOTONIC BAND-GAPS; TRANSMISSION; DIFFRACTION; MULTILAYERS; LIGHT;
D O I
10.1088/2040-8978/13/1/015602
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
One-dimensional Thue-Morse (ThMo) lattices are examples of self-similar structures that exhibit bandgap phenomena. ThMo multilayers may also possess fractal photonic bandgaps that give rise to large omnidirectional reflectance and light-emission enhancement effects. Two-dimensional (2D) ThMo aperiodic quasicrystals possess interesting properties for photonic applications too. Here we demonstrate the experimental fabrication of large area 2D ThMo lattices into polymeric substrates at nanometre scale by electron beam lithography (EBL). Far field diffraction patterns of the experimental ThMo structures have been measured and compared with the calculated theoretical Fourier spectra. Scanning electron microscopy and far field diffraction are used to characterize the experimental structures.
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页数:7
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