共 50 条
[45]
Interaction effect between electromigration and microstructure evolution in BGA structure Cu/Sn-58Bi/Cu solder interconnects
[J].
2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT),
2014,
:587-591
[50]
The influence of adding different Sn-based solder coating into Sn-58Bi/Cu interface on the growth of intermetallic compound
[J].
2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT),
2017,
:266-270