Structure and Electrical Properties of Na0.5Bi0.5TiO3 Ferroelectric Thick Films Derived From a Polymer Modified Sol-Gel Method

被引：30

作者：

Ji, Hongfen ^{[1
,2
]}

Ren, Wei ^{[1
,2
]}

Wang, Lingyan ^{[1
,2
]}

Shi, Peng ^{[1
,2
]}

Chen, Xiaofeng ^{[1
,2
]}

Wu, Xiaoqing ^{[1
,2
]}

Yao, Xi ^{[1
,2
]}

Lau, Sien-Ting ^{[3
,4
]}

Zhou, Qifa ^{[3
,4
]}

Shung, K. Kirk ^{[3
,4
]}

机构：

[1] Xi An Jiao Tong Univ, Elect Mat Res Lab, Key Lab, Minist Educ, Xian, Peoples R China

[2] Xi An Jiao Tong Univ, Int Ctr Dielect Res, Xian, Peoples R China

[3] Univ So Calif, NIH Transducer Resource Ctr, Los Angeles, CA USA

[4] Univ So Calif, Dept Biomed Engn, Los Angeles, CA 90089 USA

来源：

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL | 2011年 / 58卷 / 10期

基金：

中国国家自然科学基金; 对外科技合作项目（国际科技项目）;

关键词：

PULSED-LASER DEPOSITION; PIEZOELECTRIC PROPERTIES; MU-M; DEPENDENCE; POLYVINYLPYRROLIDONE; FABRICATION; STRESS; MODEL;

D O I：

10.1109/TUFFC.2011.2054

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

Lead-free Na0.5Bi0.5TiO3 (NBT) ferroelectric thick films were prepared by a poly(vinylpyrrolidone) (PVP) modified sol-gel method. The NBT thick films annealed from 500 degrees C to 750 degrees C exhibit a perovskite structure. The relationship between annealing temperature, thickness, and electrical properties of the thick films has been investigated. The dielectric constants and remnant polarizations of the thick films increase with annealing temperature. The electrical properties of the NBT films show strong thickness dependence. As thickness increases from 1.0 to 4.8 mu m, the dielectric constant of the NBT films increases from 620 to 848, whereas the dielectric loss is nearly independent of the thickness. The remnant polarization of the NBT thick films also increases with increasing thickness. The leakage current density first decreases and then increases with film thickness.

引用

页码：2042 / 2049

页数：8

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