A single photon resolution integrating chip for microstrip detectors

被引：18

作者：

Mozzanica, A. ^{[1
]}

Bergamaschi, A. ^{[1
]}

Dinapoli, R. ^{[1
]}

Graafsma, H. ^{[2
]}

Henrich, B. ^{[1
]}

Kraft, P. ^{[1
]}

Johnson, I. ^{[1
]}

Lohmann, M. ^{[2
]}

Schmitt, B. ^{[1
]}

Shi, X. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] DESY, D-22607 Hamburg, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 633卷

关键词：

Synchrotron radiation instrumentation; Strip detectors; Charge integrating;

D O I：

10.1016/j.nima.2010.06.112

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A charge integrating readout chip for silicon strip sensors is currently under development at Paul Sherrer Institut. The goal of the project is to provide a readout system that can sustain, through charge integration and automatic gain switching, the instantaneous many-photon deposition typical of the forthcoming XFEL machines. Nevertheless, a charge integrating readout with single photon sensitivity presents several features that can be exploited in many Synchrotron source applications: the possibility of a higher position resolution, the high photon rate capabilities and the possibility to detect low energy photon. A prototype of the readout chip (ROC) has been integrated with a strip detector and with a dedicated DAQ electronic, and it has been tested at the SYRMEP beam line (ELETTRA, Trieste). This work presents the readout chip and shows the results of the beam line tests in terms of spatial resolution and rate capabilities. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：S29 / S32

页数：4

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