Data assessment of the ARFTG microwave vector network analyzer Measurement Comparison Program

被引：1

作者：

Wong, K ^{[1
]}

机构：

[1] Hewlett Packard Co, Microwave Technol Div, Santa Rosa, CA USA

来源：

50TH ARFTG CONFERENCE DIGEST | 1997年

关键词：

D O I：

10.1109/ARFTG.1997.327268

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The purpose of the Automatic Radio Frequency Techniques Group (ARFTG) Measurement Comparison Program (MCP) is to allow participating laboratories to compare their measurements on the ARFTG standards kits to measurements obtained from other laboratories. The MCP is designed to permit the intercomparison of a large number of automatic vector network analyzers (VNA) and of different connector types. The MCP should give the participants more confidence in their measurement capability and assist them in identifying measurement deficiencies. Avast set of data has been collected from the Measurement Comparison Program. This paper presents a brief description of measurement requirements and then an assessment of the interlaboratory measurement data of each kit. Conclusions will be presented regarding the repeatability and reproducibility of each kit.

引用

页码：138 / 164

页数：27