NIEL for heavy ions: An analytical approach

被引:89
作者
Messenger, SR [1 ]
Burke, EA
Xapsos, MA
Summers, GP
Walters, RJ
Jun, I
Jordan, T
机构
[1] SFA Inc, Largo, MD 20774 USA
[2] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
[3] USN, Res Lab, Washington, DC 20375 USA
[4] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
[5] EMP Consultants, Gaithersburg, MD 20885 USA
关键词
displacement damage; nortionizing energy loss (NIEL); nuclear stopping power;
D O I
10.1109/TNS.2003.820762
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We describe an analytical model, for calculating nonionizing energy loss (NIEL) for heavy ions based on screened Coulomb potentials in the nonrelativistic limit. The model applies to any incident ion on any target material where the Coulomb interaction, is primarily responsible for atomic displacement. Results are compared with previous methods of extracting NIEL from Monte Carlo SRIM runs. Examples of NIEL calculations are given for incident ions having energies ranging from the threshold for atomic displacement to 1 GeV. The incident ions include H, He, B, Si, Fe, Xe, and An. Example targets include Si, GaAs, InP, and SiC.
引用
收藏
页码:1919 / 1923
页数:5
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