Minority carrier barrier heterojunctions for improved thermoelectric efficiency

被引:31
作者
Burke, Peter G. [1 ]
Curtin, Benjamin M. [2 ]
Bowers, John E. [1 ,2 ]
Gossard, Arthur C. [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
关键词
Thermaelectrics; Heterojunction barrier; Molecular beam epitaxy; Unipolar; ACCUMULATION; SURFACES; INAS; BAND;
D O I
10.1016/j.nanoen.2015.01.037
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We propose and demonstrate the beneficial use of minority carrier blocking layers to lessen bipolar conduction at elevated temperatures and increase the Seebeck coefficient in a thermoelectric material. Bipolar conduction, caused by thermally activated intrinsic carriers in semiconductors, causes a detrimental "roll-over" in the Seebeck coefficient and increase in thermal conductivity, measured as a function of temperature. We propose that these negative effects can be lessened or delayed in a small band gap host matrix by incorporating wider band gap semiconductor layers to impede the thermal diffusion of minority carriers over majority carriers. To prove this concept, a composite material grown by molecular beam epitaxy of ptype InAs layers and electron blocking p-type AlSb layers were grown and measured. We show improved thermoelectric properties over just p-type InAs in measurements from 110 K to 600 K. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:735 / 741
页数:7
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