Power Linearity Measurement in Terahertz Time-Domain Spectroscopy Using Metalized Film Attenuators

被引：9
|
作者：
Iida, Hitoshi [1 ]
Shimada, Yozo [1 ]
Kinoshita, Moto [1 ]
Kuroda, Hideki [2 ]
Kitagishi, Keiko [2 ]
Izutani, Yusuke [2 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan, Tsukuba, Ibaraki 3058563, Japan
[2] Otsuka Elect, Hirakata, Osaka 5731132, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 2011年 / 50卷 / 12期
关键词：
MEASUREMENT SYSTEM; FREQUENCY-RANGE;
D O I：
10.1143/JJAP.50.128004
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We describe a method for evaluating the power linearity over a wide dynamic range of a terahertz time-domain spectroscopy (THz-TDS) system. The dynamic range is achieved by means of metalized film attenuators (MFAs). The evaluation was based on repeated measurements of transmittance in a particular sample at different incident power levels. We apply the method to both focused-and collimated-beam systems and show that the method can be applied to reflectance measurements as well. (C) 2011 The Japan Society of Applied Physics
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页数：2
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