INCREASE IN THE REFLECTED INTENSITY OF X-RAY FILMS USING PHOTONIC CRYSTALS

被引:9
作者
Aly, Arafa H. [1 ]
Eissa, M. F. [1 ]
机构
[1] Beni Suef Univ, Fac Sci, Phys Dept, Bani Suwayf, Egypt
关键词
Photonic crystals; X-ray; reflected intensity; TRANSMISSION;
D O I
10.1142/S0218625X17501062
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Photographic film is the familiar image of recording X-ray method. Examinations performed with radiographic intensifying screens reduce the patients exposure to radiation of X-rays compared with those without radiographic intensifying screens, where it directs less than half of the light emitted from the X-ray film with a screen interaction. A reflective layer made of magnesium oxide or titanium dioxide is located between the screen and the base of the film; this layer can help regain the control of the header light in other directions and is forwarded to the film. One-dimensional array of photonic crystals (PCs) consists of MgO with Al and TiO2 with Al used as reflectors. This array may increase the reflected intensity by an amount of 10.88% if MgO-Al PCs with periodicity N = 1 are used as reflectors.
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页数:5
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