Out-of-plane displacement field measurement by shearography

被引:21
作者
Bai, Pengxiang [1 ]
Zhu, Feipeng [2 ]
He, Xiaoyuan [1 ]
机构
[1] Southeast Univ, Dept Engn Mech, Nanjing 210018, Jiangsu, Peoples R China
[2] Hohai Univ, Coll Mech & Mat, Nanjing 210098, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
Shearography; Out-of-plane displacement; Optical nondestructive testing; PROJECTION PROFILOMETRY; DEFORMATION MEASUREMENT; SPECKLE; INTERFEROMETER;
D O I
10.1016/j.optlastec.2015.04.015
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Existing shearography systems measuring out-of-plane displacements suffer from boundary-constraint or reference surface requirements. Therefore, we propose an accurate non-uniform out-of-plane displacement field measurement method based on a modified shearography system and two-step integration method. The proposed method combines high-resolution interferometry with the advantage of relaxing the environmental stability requirements. The modified shearography system adopts three beam splitters and two switches when compared with conventional optical configurations. The three beam splitters are used to construct a modified Michelson interferometer that shears the image along two orthogonal directions, and the shearing direction can be switched by the two hardware switches between the orthogonal directions. With phase shifting performed on the recorded images, the out-of-plane displacement gradients along the orthogonal directions are extracted sequentially. In general, without boundary restrictions on the object surface, it is difficult to directly extract out-of-plane displacement from a single displacement gradient field. Accordingly, the two-step integration method is proposed and applied to the orthogonal displacement gradients to extract the relative out-of-plane displacement field without any boundary conditions of the object surface provided. Experiments are performed on a clamped circular plate with uniform loading, and the results are compared with electronic speckle pattern interferometry (ESPI) results to validate the proposed method. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:29 / 38
页数:10
相关论文
共 24 条
[1]   Strain distributions made visible with image-shearing speckle pattern interferometry [J].
Aebischer, HA ;
Waldner, S .
OPTICS AND LASERS IN ENGINEERING, 1997, 26 (4-5) :407-420
[2]   Dynamic out-of-plane deformation measurement using virtual speckle patterns [J].
Arai, Yasuhiko ;
Shimamura, Ryouichi ;
Yokozeki, Shunsuke .
OPTICS AND LASERS IN ENGINEERING, 2009, 47 (05) :563-569
[3]   Automatic full strain field Moire interferometry measurement with nano-scale resolution [J].
Chen, B. ;
Basaran, C. .
EXPERIMENTAL MECHANICS, 2008, 48 (05) :665-673
[4]   High-speed ESPI and related techniques: overview and its application in the automotive industry [J].
Chen, F ;
Luo, WD ;
Dale, M ;
Petniunas, A ;
Harwood, P ;
Brown, GM .
OPTICS AND LASERS IN ENGINEERING, 2003, 40 (5-6) :459-485
[5]   Shearography technology and applications: a review [J].
Francis, D. ;
Tatam, R. P. ;
Groves, R. M. .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2010, 21 (10)
[6]   Polarization-multiplexed and phase-stepped fibre optic shearography using laser wavelength modulation [J].
Groves, RM ;
James, SW ;
Tatam, RP .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2000, 11 (09) :1389-1395
[7]   High-speed 3-D shape measurement based on digital fringe projection [J].
Huang, PSS ;
Zhang, CP ;
Chiang, FP .
OPTICAL ENGINEERING, 2003, 42 (01) :163-168
[8]   NDT&E using shearography with impulsive thermal stressing and clustering phase extraction [J].
Huang, Y. H. ;
Ng, S. P. ;
Liu, L. ;
Li, C. L. ;
Chen, Y. S. ;
Hung, Y. Y. .
OPTICS AND LASERS IN ENGINEERING, 2009, 47 (7-8) :774-781
[9]   Dynamic phase measurement in shearography by clustering method and Fourier filtering [J].
Huang, Yuanhao ;
Janabi-Sharifi, Farrokh ;
Liu, Yusheng ;
Hung, Y. Y. .
OPTICS EXPRESS, 2011, 19 (02) :606-615
[10]   Unified approach for holography and shearography in surface deformation measurement and nondestructive testing [J].
Hung, MYY ;
Shang, HM ;
Yang, LX .
OPTICAL ENGINEERING, 2003, 42 (05) :1197-1207