Defect-induced dimer pinning on the Si(001) surface

被引:13
|
作者
Wilson, HF [1 ]
Marks, NA [1 ]
McKenzie, DR [1 ]
机构
[1] Univ Sydney, Sch Phys, Ctr Quantum Comp Technol, Sydney, NSW 2006, Australia
基金
澳大利亚研究理事会;
关键词
surface relaxation and reconstruction; ab initio quantum chemical methods and calculations; Monte-Carlo simulations; Ising models; scanning tunneling microscopy; silicon;
D O I
10.1016/j.susc.2005.05.017
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Room-temperature STM images frequently show regions of antisymmetric dimer ordering surrounding certain types of defect on the Si(0 0 1) surface. While it has been generally believed that any defect asymmetric with respect to the dimer row would induce this dimer pinning effect, recent experimental results have shown that this is not the case. We present a model, based on a nearest-neighbour Ising treatment of the surface, which allows the extent of pinning caused by a dimer to be predicted from ab initio calculations. We use this model to predict the pinning extent for three phosphorus-containing structures important in a proposed silicon-based quantum computer fabrication scheme, and identify one of these asymmetric features as causing no appreciable pinning. In addition, we use ab initio calculations to identify the effects governing the interaction between neighbouring dimers. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:185 / 192
页数:8
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