Infrared optical properties of SiO2 films on silicon substrate under different temperatures

被引：4

作者：

Jiang, Yugang ^{[1
,2
]}

Liu, Huasong ^{[1
,2
]}

Bai, Jinlin ^{[1
,2
]}

Li, Ziyang ^{[1
,2
]}

Yang, Xiao ^{[1
,2
]}

Chen, Dan ^{[1
,2
]}

He, Jiahuan ^{[1
,2
]}

Wang, Lishuan ^{[1
,2
]}

Liu, Dandan ^{[1
,2
]}

机构：

[1] Tianjin Jinhang Tech Phys Inst, Tianjin Key Lab Opt Thin Film, Tianjin, Peoples R China

[2] Joint Labs Optoelect Mat & Intelligent Surface St, Tianjin, Peoples R China

来源：

OPTICAL ENGINEERING | 2022年 / 61卷 / 03期

基金：

中国国家自然科学基金;

关键词：

high temperature optical properties; SiO2; films; optical constant; vibration structure; DEPOSITION; SIO2;

D O I：

10.1117/1.OE.61.3.031204

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

SiO2 is a very important low refractive index film material that can operate in the UV to mid-IR regions. The SiO2 films used were deposited on Si substrates by different deposition techniques. We designed and manufactured a high-temperature infrared spectrum measuring equipment connected with a Fourier transform infrared (FTIR) spectrometer; the measuring temperature could range from room-temperature to 600 degrees C. The FTIR transmission spectra of SiO2 films under different working temperatures were measured in the wavenumber region from 4000 to 400 cm (- 1). From the measured spectra, it can be seen that IBS-SiO2 and IAD-SiO2 films are more stable and operating temperature can reach 400 degrees C. EB-SiO2 film is worse and operating temperature is only 300 degrees C. Complex dielectric functions of SiO2 films under different temperature conditions were calculated from FTIR transmittance spectra, and the best fitted method was obtained for calculating optical constants of dielectric materials in the high temperature condition. The results show that the structure of the Si-O-Si network in IBS-SiO2 films was the most stable structure. The experimental results were of great significance to practical application. (c) 2021 Society of Photo-Optical Instrumentation Engineers (SPIE)

引用

页数：7

共 18 条

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