Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry

被引:13
|
作者
Jayakumar, Naveen Kumar Tumkur [1 ]
Benoit, Evan [1 ]
Kingston, Samuel [1 ]
Saleh, Mashad Uddin [1 ]
Scarpulla, Michael [1 ]
Harley, Joel B. [3 ]
Furse, Cynthia [1 ,2 ]
机构
[1] Univ Utah, Dept Elect Engn, Salt Lake City, UT 84112 USA
[2] LiveWire Innovat, Camarillo, CA 93012 USA
[3] Univ Florida, Dept Elect Engn, Gainesville, FL 32611 USA
关键词
Sensor phenomena; accuracy; fault location; reflectometry; resolution; spread spectrum time-domain reflectometry (SSTDR);
D O I
10.1109/LSENS.2019.2916636
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N-2). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry.
引用
收藏
页数:4
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