Avalanche photodiode for measurement of low-energy electrons

被引:13
作者
Ogasawara, K [1 ]
Asamura, K [1 ]
Mukai, T [1 ]
Saito, Y [1 ]
机构
[1] Japan Aerosp Explorat Agcy, Inst Space & Astronaut Sci, Sagamihara, Kanagawa 2298510, Japan
关键词
Avalanche photodiode; electron detection; temperature dependence; Monte Carlo; dead layer; X-ray detection;
D O I
10.1016/j.nima.2005.02.026
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We report on the performance of an Avalanche Photodiode (APD) produced by Hamamatsu Photonics Co. Ltd. (Type Z7966-20) for measurements of low energy electrons. We have set up an electron gun, which can generate a 1-20keV electron beam impinging onto the APD in a vacuum chamber. The result shows that the pulse height distribution (PHD) of the APD signal exhibits a significant peak for electrons with energies above 8keV, and the variation of the PHD peak shows a good linearity with the energy of incident electrons. The energy resolution is quite good, though it slightly depends on the electron energy. In the case of low-energies (lower than 10 keV), the pulse height distribution has a characteristic tail on the low energy side, and the energy resolution becomes a little worse. The position of the peak appears on a slightly lower channel than is expected from data at higher energies (near 20keV). Qualitatively, the low-energy tail is caused by the dead-layer on the surface of the device. The nonlinearity and the worse resolution of the peaks for higher energy electrons may have resulted from a space-charge effect due to created e-h pairs. For a quantitative understanding, we have made a Monte Carlo particle simulation of charge transport and collection inside the APD. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:744 / 752
页数:9
相关论文
共 10 条
[1]   Failure modes of large surface avalanche photo diodes in high-energy physics environments [J].
Anzivino, G ;
Bai, J ;
Bencheikh, B ;
Contin, A ;
DeSalvo, R ;
Fagen, S ;
He, H ;
Liu, L ;
Lundin, M ;
Madden, RM ;
Mondardini, MR ;
Szawlowski, M ;
Wang, K ;
Xia, X ;
Yang, C ;
Zhao, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 430 (01) :100-109
[2]  
BROWNING R, 1995, SCANNING, V17, P250, DOI 10.1002/sca.4950170406
[3]   Response of 100% internal quantum efficiency silicon photodiodes to 200 eV-40 keV electrons [J].
Funsten, HO ;
Suszcynsky, DM ;
Ritzau, SM ;
Korde, R .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) :2561-2565
[4]  
Joy D.C., 1995, MONTE CARLO MODELING
[5]  
Knoll GF., 2000, Radiation Detection and Measurement, Vthird
[6]   MULTIPLICATION NOISE IN UNIFORM AVALANCHE DIODES [J].
MCINTYRE, RJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (01) :164-+
[7]   Large area avalanche photodiodes in scintillation and X-rays detection [J].
Moszynski, M ;
Szawlowski, M ;
Kapusta, M ;
Balcerzyk, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 485 (03) :504-521
[8]  
NEWBURY DE, 1981, ANAL ELECTRON MICROS, P91
[9]   Study of a large area avalanche photodiode as a fast photon and a soft X-ray detector [J].
Ochi, A ;
Nishi, Y ;
Tanimori, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 378 (1-2) :267-274
[10]   ABSOLUTE EFFICIENCY MEASUREMENTS FOR CHANNEL ELECTRON MULTIPLIERS UTILIZING A UNIQUE ELECTRON SOURCE [J].
PASCHMANN, G ;
SHELLEY, EG ;
CHAPPELL, CR ;
SHARP, RD ;
SMITH, LF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12) :1706-+