Coherent X-ray diffractive imaging: applications and limitations

被引:110
作者
Marchesini, S
Chapman, HN
Hau-Riege, SP
London, RA
Szoke, A
He, H
Howells, MR
Padmore, H
Rosen, R
Spence, JCH
Weierstall, U
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
[3] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
来源
OPTICS EXPRESS | 2003年 / 11卷 / 19期
关键词
D O I
10.1364/OE.11.002344
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our recent experimental results, in which Xray images were reconstructed from the diffraction pattern alone. A preliminary analysis of the radiation dose needed for CXDI imaging and the dose tolerance of frozen-hydrated life-science samples suggests that 3D tomography at a resolution of about 10 nm may be possible. In material science, where samples are less sensitive to radiation damage, we expect CXDI to be able to achieve 1 to 2 nm resolution using modern x-ray synchrotron sources. For higher resolution imaging of biological material, strategies based on fast-pulse illumination from proposed x-ray free-electron laser sources, can be considered as described in Neutze et al. Nature 406, 752- 757 (2000). (C) 2003 Optical Society of America.
引用
收藏
页码:2344 / 2353
页数:10
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