High aspect ratio parylene etching for microfluidics and bioMEMS
被引:0
作者:
Meng, E
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USAUniv Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USA
Meng, E
[1
]
Aoyagi, S
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h-index: 0
机构:
Univ Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USAUniv Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USA
Aoyagi, S
[1
]
Tai, YC
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USAUniv Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USA
Tai, YC
[1
]
机构:
[1] Univ Calif Davis, Dept Mech & Aeronaut Engn, Davis, CA 95616 USA
来源:
MICRO TOTAL ANALYSIS SYSTEMS 2004, VOL 2
|
2005年
/
297期
关键词:
parylene;
DRIE;
high aspect ratio;
bioMEMS;
microfluidics;
D O I:
暂无
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
A novel technique for producing high aspect ratio parylene structures via switching chemistry plasma etching is presented. Parylene C, or poly(monochloro-p-xylylene), has become an increasingly popular MEMS material for its excellent properties and biocompatibility. However, the inability to fabricate closely-spaced high aspect ratio (HAR) structures severely limits the use of parylene, particularly in microfluidic and bioMEMS applications. A novel method was developed to etch thin film parylene deposited on silicon substrates. Several masking materials were investigated to optimize this process. This low-temperature (< 120 degrees C) technique is compatible with standard MEMS processes and can accommodate post-CMOS processing. Etching recipes have already been applied to bioMEMS devices and can greatly extend the range of possible structures for bioMEMS and microfluidics applications.
机构:
Louis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USALouis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
Hess-Dunning, Allison E.
Smith, Russell L.
论文数: 0引用数: 0
h-index: 0
机构:
Case Western Reserve Univ, Dept Elect Engn & Comp Sci, Cleveland, OH 44016 USALouis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
Smith, Russell L.
Zorman, Christian A.
论文数: 0引用数: 0
h-index: 0
机构:
Louis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
Case Western Reserve Univ, Dept Elect Engn & Comp Sci, Cleveland, OH 44016 USALouis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
机构:
Louis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USALouis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
Hess-Dunning, Allison E.
Smith, Russell L.
论文数: 0引用数: 0
h-index: 0
机构:
Case Western Reserve Univ, Dept Elect Engn & Comp Sci, Cleveland, OH 44016 USALouis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
Smith, Russell L.
Zorman, Christian A.
论文数: 0引用数: 0
h-index: 0
机构:
Louis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA
Case Western Reserve Univ, Dept Elect Engn & Comp Sci, Cleveland, OH 44016 USALouis Stokes Cleveland VA Med Ctr, Adv Platform Technol Ctr Excellence, Cleveland, OH 44106 USA