Nanoscale chemical imaging by photoinduced force microscopy

被引:243
作者
Nowak, Derek [1 ]
Morrison, William [1 ]
Wickramasinghe, H. Kumar [2 ]
Jahng, Junghoon [3 ]
Potma, Eric [4 ]
Wan, Lei [5 ]
Ruiz, Ricardo [5 ]
Albrecht, Thomas R. [5 ]
Schmidt, Kristin [6 ]
Frommer, Jane [6 ]
Sanders, Daniel P. [6 ]
Park, Sung [1 ]
机构
[1] Mol Vista Inc, 6840 Via Del Oro,Suite 110, San Jose, CA 95119 USA
[2] Univ Calif Irvine, Dept Elect Engn & Comp Sci, Irvine, CA 92697 USA
[3] Univ Calif Irvine, Dept Phys & Astron, Irvine, CA 92697 USA
[4] Univ Calif Irvine, Dept Chem, Irvine, CA 92697 USA
[5] HGST San Jose Res Ctr, 3403 Yerba Buena Rd, San Jose, CA 95135 USA
[6] IBM Res Almaden, 650 Harry Rd, San Jose, CA 95120 USA
来源
SCIENCE ADVANCES | 2016年 / 2卷 / 03期
基金
美国国家科学基金会;
关键词
BLOCK-COPOLYMERS; THIN-FILMS; RESOLUTION; FIELD; LITHOGRAPHY;
D O I
10.1126/sciadv.1501571
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing non-destructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.
引用
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页数:9
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